Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Damage review on gate stack test structures after high-velocity aerosol cleaning
Publication:
Damage review on gate stack test structures after high-velocity aerosol cleaning
Date
2007
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wostyn, Kurt
;
Sano, Ken-Ichi
;
De Marco, Cinzia
;
Kenis, Karine
;
Van Den Heuvel, Dieter
;
Janssens, Tom
;
Bearda, Twan
;
Leunissen, Peter
;
Mertens, Paul
;
Eitoku, Atsuro
Journal
Abstract
Description
Metrics
Views
2057
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
2057
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations