Publication:
Characterization of atomic layer deposited nanoscale structure on dense dielectric substrates by X-ray reflectivity
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1913 since deposited on 2021-10-16
6last month
3last week
Acq. date: 2026-04-28
Citations
Statistics
Views
1913 since deposited on 2021-10-16
6last month
3last week
Acq. date: 2026-04-28
Citations