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Impact of PECVD-prepared interfacial Si and SiGe layers on epitaxial Si films grown by PECVD (200 degrees C) and APCVD (1130 degrees C)
Publication:
Impact of PECVD-prepared interfacial Si and SiGe layers on epitaxial Si films grown by PECVD (200 degrees C) and APCVD (1130 degrees C)
Date
2021
Journal article
https://doi.org/10.1016/j.apsusc.2021.149056
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
An, Junyang
;
Maurice, Jean-Luc
;
Roca i Cabarrocas, Pere
;
Chen, Wanghua
;
Depauw, Valerie
Journal
APPLIED SURFACE SCIENCE
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410
since deposited on 2022-02-24
Acq. date: 2025-10-23
Views
1892
since deposited on 2022-02-24
Acq. date: 2025-10-23
Citations
Metrics
Downloads
410
since deposited on 2022-02-24
Acq. date: 2025-10-23
Views
1892
since deposited on 2022-02-24
Acq. date: 2025-10-23
Citations