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RTN insight to filamentary instability and disturb immunity in ultra-low power switching HfOx and AlOx-based RRAM
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RTN insight to filamentary instability and disturb immunity in ultra-low power switching HfOx and AlOx-based RRAM
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Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Raghavan, Naga
;
Degraeve, Robin
;
Goux, Ludovic
;
Fantini, Andrea
;
Wouters, Dirk
;
Groeseneken, Guido
;
Jurczak, Gosia
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1930
since deposited on 2021-10-21
2
last month
Acq. date: 2025-12-15
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Metrics
Views
1930
since deposited on 2021-10-21
2
last month
Acq. date: 2025-12-15
Citations