Publication:

RTN insight to filamentary instability and disturb immunity in ultra-low power switching HfOx and AlOx-based RRAM

Date

2013
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorRaghavan, Naga
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGoux, Ludovic
dc.contributor.authorFantini, Andrea
dc.contributor.authorWouters, Dirk
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorJurczak, Gosia
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.accessioned2021-10-21T11:13:57Z
dc.date.available2021-10-21T11:13:57Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22973
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6576642&queryText%3DRTN+insight+to+filamentary+instability+and+di
dc.source.beginpageT164
dc.source.conferenceSymposium on VLSI Technology
dc.source.conferencedate11/06/2013
dc.source.conferencelocationKyoto Japan
dc.source.endpageT165
dc.title

RTN insight to filamentary instability and disturb immunity in ultra-low power switching HfOx and AlOx-based RRAM

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions