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Influence of doping and tunneling interface stoichiometry on n+In0.5Ga0.5As/p+GaAs0.5Sb0.5 Esaki diode behavior

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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-3742-9017
cris.virtual.orcid0000-0003-3463-416X
cris.virtual.orcid0000-0002-8062-3165
cris.virtual.orcid0000-0002-3994-8021
cris.virtual.orcid0000-0002-2356-5915
cris.virtual.orcid0000-0003-3084-2543
cris.virtualsource.department8453626e-0277-4da2-913a-9d997d2a144f
cris.virtualsource.departmentfa867be9-6d43-441a-8209-5ffdc9d82a84
cris.virtualsource.departmentc807a03a-358d-4274-b622-dee889a60454
cris.virtualsource.departmentdf8401d6-bf8a-4030-b504-322d3c8b038d
cris.virtualsource.department2278f1c0-d873-46fa-9ffd-a7813ebb3f50
cris.virtualsource.department77d06c14-6a7b-4d80-9c75-962dea483414
cris.virtualsource.orcid8453626e-0277-4da2-913a-9d997d2a144f
cris.virtualsource.orcidfa867be9-6d43-441a-8209-5ffdc9d82a84
cris.virtualsource.orcidc807a03a-358d-4274-b622-dee889a60454
cris.virtualsource.orciddf8401d6-bf8a-4030-b504-322d3c8b038d
cris.virtualsource.orcid2278f1c0-d873-46fa-9ffd-a7813ebb3f50
cris.virtualsource.orcid77d06c14-6a7b-4d80-9c75-962dea483414
dc.contributor.authorEl Kazzi, Salim
dc.contributor.authorAlian, AliReza
dc.contributor.authorBordallo, Caio
dc.contributor.authorSmets, Quentin
dc.contributor.authorDesplanque, Ludovic
dc.contributor.authorWallart, Xavier
dc.contributor.authorRichard, Olivier
dc.contributor.authorDouhard, Bastien
dc.contributor.authorVerhulst, Anne
dc.contributor.authorCollaert, Nadine
dc.contributor.authorMerckling, Clement
dc.contributor.authorHeyns, Marc
dc.contributor.authorThean, Aaron
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorDouhard, Bastien
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.date.accessioned2021-10-23T10:44:03Z
dc.date.available2021-10-23T10:44:03Z
dc.date.embargo9999-12-31
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26594
dc.identifier.urlhttp://ecst.ecsdl.org/content/72/3/73.abstract
dc.source.beginpage73
dc.source.conferenceInternational Symposium on Functional Diversification of Semiconductor Electronics 3 (More-Than-Moore 3)
dc.source.conferencedate29/05/2016
dc.source.conferencelocationSan Diego, CA USA
dc.source.endpage80
dc.title

Influence of doping and tunneling interface stoichiometry on n+In0.5Ga0.5As/p+GaAs0.5Sb0.5 Esaki diode behavior

dc.typeProceedings paper
dspace.entity.typePublication
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