Publication:
Negative Bias Temperature Instability (NBTI) in p-FinFETs with 45-degree substrate rotation
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1957 since deposited on 2021-10-21
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Acq. date: 2026-01-11
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Views
1957 since deposited on 2021-10-21
3last month
3last week
Acq. date: 2026-01-11
Citations