Publication:

Negative Bias Temperature Instability (NBTI) in p-FinFETs with 45-degree substrate rotation

Date

2013

Journal article

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Author(s)

;

Ritzenthaler, Romain

;

;

Higuchi, Yuichi

;

;

Chiarella, Thomas

;

Boccardi, Guillaume

;

Togo, Mitsuhiro

;

Horiguchi, Naoto

;

Kauerauf, Thomas

;

Groeseneken, Guido

Journal

IEEE Electron Device Letters

Statistics

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Acq. date: 2026-03-17