Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Influence of fin width on the total dose behavior of p-channe bulk MuGFETs
Publication:
Influence of fin width on the total dose behavior of p-channe bulk MuGFETs
Date
2010
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
20424.pdf
443.8 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Put, Sofie
;
Simoen, Eddy
;
Jurczak, Gosia
;
Van Uffelen, Marco
;
Leroux, Paul
;
Claeys, Cor
Journal
IEEE Electron Device Letters
Abstract
Description
Metrics
Views
1914
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1914
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations