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Electric-field induced quantum broadening of the characteristic energy level of traps in semiconductors and oxides
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Electric-field induced quantum broadening of the characteristic energy level of traps in semiconductors and oxides
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Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mohammed, Mazharuddin
;
Verhulst, Anne
;
Verreck, Devin
;
Degraeve, Robin
;
Kaczer, Ben
;
Simoen, Eddy
;
Soree, Bart
;
Van de Put, Maarten
;
Mocuta, Anda
;
Collaert, Nadine
;
Thean, Aaron
;
Groeseneken, Guido
Journal
Journal of Applied Physics
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1898
since deposited on 2021-10-23
Acq. date: 2025-12-11
Citations
Metrics
Views
1898
since deposited on 2021-10-23
Acq. date: 2025-12-11
Citations