Publication:

DC Reliability study of high-k GaN-on-Si MOS-HEMT's for mm-Wave Power Amplifiers

Date

2024

Proceedings Paper

https://doi.org/10.1109/IRPS48228.2024.10529379

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Author(s)

O'Sullivan, Barry

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Sibaja-Hernandez, Arturo

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Peralagu, Uthayasankaran

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Vaisman Chasin, Adrian

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Parvais, Bertrand

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Collaert, Nadine

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426 since deposited on 2024-08-16

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Acq. date: 2026-01-26