Publication:
Contactless mobility measurements of inversion charge carriers on silicon substrates with SiO2 and HfO2 gate dielectrics
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Downloads
1 since deposited on 2021-10-18
Acq. date: 2026-01-25
Views
1935 since deposited on 2021-10-18
3last month
3last week
Acq. date: 2026-01-25
Citations
Statistics
Downloads
1 since deposited on 2021-10-18
Acq. date: 2026-01-25
Views
1935 since deposited on 2021-10-18
3last month
3last week
Acq. date: 2026-01-25
Citations