Publication:
Contactless mobility measurements of inversion charge carriers on silicon substrates with SiO2 and HfO2 gate dielectrics
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1 since deposited on 2021-10-18
Acq. date: 2025-12-09
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1932 since deposited on 2021-10-18
Acq. date: 2025-12-09
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1 since deposited on 2021-10-18
Acq. date: 2025-12-09
Views
1932 since deposited on 2021-10-18
Acq. date: 2025-12-09
Citations