Publication:
CMOS-compatible surface-micromachined test structure for determination of thermal conductivity of thin film materials based on Seebeck effect
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1890 since deposited on 2021-10-18
2last month
2last week
Acq. date: 2026-08-07
Citations
Statistics
Views
1890 since deposited on 2021-10-18
2last month
2last week
Acq. date: 2026-08-07
Citations