Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
CMOS-compatible surface-micromachined test structure for determination of thermal conductivity of thin film materials based on Seebeck effect
Statistics
Statistics by Category
Download view's map
PNG
JPEG/JPG
Reports
Most viewed
Most viewed per month
Top city views
File Visits
Export Excel
Export CSV
Item
Views
CMOS-compatible surface-micromachined test structure for determination of thermal conductivity of thin film materials based on Seebeck effect
1356