Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Epitaxial strained silicon passivation of the Ge/high-k interface in germanium pMOSFET
Publication:
Epitaxial strained silicon passivation of the Ge/high-k interface in germanium pMOSFET
Date
2008
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
16826.pdf
172.88 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Leys, Frederik
;
Mitard, Jerome
;
Martens, Koen
;
Pourtois, Geoffrey
;
Houssa, Michel
;
Brunco, D.P.
;
Kaczer, Ben
;
De Jaeger, Brice
;
Loo, Roger
;
Meuris, Marc
;
Caymax, Matty
;
Heyns, Marc
Journal
Abstract
Description
Metrics
Views
1872
since deposited on 2021-10-17
Acq. date: 2025-12-08
Citations
Metrics
Views
1872
since deposited on 2021-10-17
Acq. date: 2025-12-08
Citations