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Detection of split design-related weak points in double patterning using PQW and bright-field defect inspection
Publication:
Detection of split design-related weak points in double patterning using PQW and bright-field defect inspection
Date
2008
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Den Heuvel, Dieter
;
Cheng, Shaunee
;
Leray, Philippe
;
Wiaux, Vincent
;
Maenhoudt, Mireille
;
D'have, Koen
;
Jaenen, Patrick
;
Marcuccilli, Gino
;
Malik, Irfan
;
Klein, Sophie
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1933
since deposited on 2021-10-17
415
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1933
since deposited on 2021-10-17
415
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations