Publication:

Extreme scaled gate dielectrics by using ALD Hf-based composite materials

Date

 
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-1057-8140
cris.virtual.orcid0000-0001-7547-7194
cris.virtual.orcid0000-0003-1533-7055
cris.virtual.orcid0000-0002-4831-3159
cris.virtualsource.departmentee7e6e4c-3b87-41b4-9995-a519c69c638e
cris.virtualsource.department5afcb429-ac38-4c13-8422-3088287ba9bd
cris.virtualsource.department2fc65eb2-c2f1-4505-bb09-96f2d0aa6ce9
cris.virtualsource.department3e839b18-b9e5-46f9-95d4-760837031f7a
cris.virtualsource.orcidee7e6e4c-3b87-41b4-9995-a519c69c638e
cris.virtualsource.orcid5afcb429-ac38-4c13-8422-3088287ba9bd
cris.virtualsource.orcid2fc65eb2-c2f1-4505-bb09-96f2d0aa6ce9
cris.virtualsource.orcid3e839b18-b9e5-46f9-95d4-760837031f7a
dc.contributor.authorPierreux, Dieter
dc.contributor.authorMachkaoutsan, Vladimir
dc.contributor.authorTois, E.
dc.contributor.authorSwerts, Johan
dc.contributor.authorSchram, Tom
dc.contributor.authorAdelmann, Christoph
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorTseng, Joshua
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorMaes, Jan
dc.contributor.imecauthorPierreux, Dieter
dc.contributor.imecauthorMachkaoutsan, Vladimir
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorMaes, Jan
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.date.accessioned2021-10-18T01:43:11Z
dc.date.available2021-10-18T01:43:11Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16019
dc.source.beginpage2037
dc.source.conference216th ECS Meeting
dc.source.conferencedate4/10/2009
dc.source.conferencelocationVienna Austria
dc.title

Extreme scaled gate dielectrics by using ALD Hf-based composite materials

dc.typeMeeting abstract
dspace.entity.typePublication
Files

Original bundle

Name:
18999.pdf
Size:
41.56 KB
Format:
Adobe Portable Document Format
Publication available in collections: