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Transient analysis based thermal characterization of die-die interfaces in 3D-ICs
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Transient analysis based thermal characterization of die-die interfaces in 3D-ICs
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Date
2012-05
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Oprins, Herman
;
Cherman, Vladimir
;
Rebibis, Kenneth June
;
Vermeersch, Kristina
;
Gerets, Carine
;
Vandevelde, Bart
;
La Manna, Antonio
;
Beyer, Gerald
;
Beyne, Eric
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1880
since deposited on 2021-10-20
Acq. date: 2025-12-16
Citations
Metrics
Views
1880
since deposited on 2021-10-20
Acq. date: 2025-12-16
Citations