Publication:
Reliability characterization of thermal micro-structures implemented on 0.8 mu m CMOS chips
Date
| dc.contributor.author | Sheng, L. Y. | |
| dc.contributor.author | De Tandt, Cathleen | |
| dc.contributor.author | Ranson, Willy | |
| dc.contributor.author | Vounckx, Roger | |
| dc.contributor.imecauthor | Vounckx, Roger | |
| dc.date.accessioned | 2021-10-14T13:46:11Z | |
| dc.date.available | 2021-10-14T13:46:11Z | |
| dc.date.issued | 2000 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4741 | |
| dc.source.beginpage | 112 | |
| dc.source.conference | 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual; | |
| dc.source.conferencelocation | ||
| dc.source.endpage | 117 | |
| dc.title | Reliability characterization of thermal micro-structures implemented on 0.8 mu m CMOS chips | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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