Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Noise characteristics and hot carrier stress of 0.7 µm MOSFETs
Publication:
Noise characteristics and hot carrier stress of 0.7 µm MOSFETs
Date
1996
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
1280.pdf
179.47 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Koktavy, P.
;
Koktavy, B.
;
Sikula, J.
;
Claeys, Cor
;
Simoen, Eddy
Journal
Abstract
Description
Metrics
Downloads
2
since deposited on 2021-09-29
Acq. date: 2025-10-24
Views
1988
since deposited on 2021-09-29
427
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Downloads
2
since deposited on 2021-09-29
Acq. date: 2025-10-24
Views
1988
since deposited on 2021-09-29
427
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations