Publication:

Noise characteristics and hot carrier stress of 0.7 µm MOSFETs

Date

1996
Proceedings Paper
Simple item page Full metadata Statistics
 
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-5218-4046
cris.virtualsource.department715a9ada-0798-46d2-a8ca-4775db9a8e46
cris.virtualsource.orcid715a9ada-0798-46d2-a8ca-4775db9a8e46
dc.contributor.authorKoktavy, P.
dc.contributor.authorKoktavy, B.
dc.contributor.authorSikula, J.
dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-09-29T14:39:55Z
dc.date.available2021-09-29T14:39:55Z
dc.date.embargo9999-12-31
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1304
dc.source.beginpage134
dc.source.conferenceProceedings 3rd ELEN Workshop
dc.source.conferencedate5/11/1996
dc.source.conferencelocationLeuven Belgium
dc.source.endpage139
dc.title

Noise characteristics and hot carrier stress of 0.7 µm MOSFETs

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
1280.pdf
Size:
179.47 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions