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Energy and angular dependent profiling of thin (0.5 - 2.5 nm) oxide layers
Publication:
Energy and angular dependent profiling of thin (0.5 - 2.5 nm) oxide layers
Date
1999
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandervorst, Wilfried
;
Conard, Thierry
;
De Witte, Hilde
;
Cooke, G. A.
Journal
Abstract
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1918
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1918
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations