Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers
Publication:
Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers
Copy permalink
Date
2008
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Brouwers, Gijs
;
Eneman, Geert
;
Bargallo Gonzalez, Mireia
;
De Jaeger, Brice
;
Mitard, Jerome
;
Brunco, David
;
Souriau, Laurent
;
Cody, N.
;
Thomas, S.
;
Meuris, Marc
Journal
Materials Science in Semiconductor Processing
Abstract
Description
Metrics
Views
1979
since deposited on 2021-10-17
2
last month
Acq. date: 2026-01-06
Citations
Metrics
Views
1979
since deposited on 2021-10-17
2
last month
Acq. date: 2026-01-06
Citations