Publication:

Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers

Date

2008

Journal article

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Author(s)

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Bargallo Gonzalez, Mireia

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De Jaeger, Brice

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Souriau, Laurent

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Journal

Materials Science in Semiconductor Processing

Statistics

1986 since deposited on 2021-10-17

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Acq. date: 2026-02-24