Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers

Publication:

2008

Journal article

Author(s)

;

Brouwers, Gijs

;

;

Bargallo Gonzalez, Mireia

;

;

;

Brunco, David

;

;

Cody, N.

;

Thomas, S.

;

Materials Science in Semiconductor Processing

1986 since deposited on 2021-10-17

Acq. date: 2026-06-23