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Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers
Publication:
Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers
Date
2008
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Brouwers, Gijs
;
Eneman, Geert
;
Bargallo Gonzalez, Mireia
;
De Jaeger, Brice
;
Mitard, Jerome
;
Brunco, David
;
Souriau, Laurent
;
Cody, N.
;
Thomas, S.
;
Meuris, Marc
Journal
Materials Science in Semiconductor Processing
Abstract
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1973
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1973
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations