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Experimental identification of unique oxide defect regions by characteristic response of charge pumping
Publication:
Experimental identification of unique oxide defect regions by characteristic response of charge pumping
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Date
2011-04
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Masuduzzaman, M.
;
Islam, Ahmad
;
Degraeve, Robin
;
Cho, Moon Ju
;
Zahid, Mohammed
;
Alam, M.A.
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1908
since deposited on 2021-10-19
Acq. date: 2025-12-12
Citations
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Views
1908
since deposited on 2021-10-19
Acq. date: 2025-12-12
Citations