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Experimental identification of unique oxide defect regions by characteristic response of charge pumping

Date

2011-04
Proceedings Paper
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-4609-5573
cris.virtualsource.department8b84673b-878f-4c3b-959d-b7cdae2d70d9
cris.virtualsource.orcid8b84673b-878f-4c3b-959d-b7cdae2d70d9
dc.contributor.authorMasuduzzaman, M.
dc.contributor.authorIslam, Ahmad
dc.contributor.authorDegraeve, Robin
dc.contributor.authorCho, Moon Ju
dc.contributor.authorZahid, Mohammed
dc.contributor.authorAlam, M.A.
dc.contributor.imecauthorDegraeve, Robin
dc.date.accessioned2021-10-19T16:10:01Z
dc.date.available2021-10-19T16:10:01Z
dc.date.embargo9999-12-31
dc.date.issued2011-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19402
dc.source.beginpage207
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate10/04/2011
dc.source.conferencelocationCalifonia USA
dc.source.endpage212
dc.title

Experimental identification of unique oxide defect regions by characteristic response of charge pumping

dc.typeProceedings paper
dspace.entity.typePublication
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