Publication:

Optimization of scatterometry parameters for the gate level of the 90nm node

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1828 since deposited on 2021-10-16
2last month
2last week
Acq. date: 2026-05-17

Citations

Statistics

Views

1828 since deposited on 2021-10-16
2last month
2last week
Acq. date: 2026-05-17

Citations