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Optimization of scatterometry parameters for the gate level of the 90nm node
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Optimization of scatterometry parameters for the gate level of the 90nm node
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Date
2005
Proceedings Paper
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12037.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Leray, Philippe
;
Cheng, Shaunee
Journal
Abstract
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1824
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Acq. date: 2025-12-15
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Views
1824
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-15
Citations