Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Towards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs
Publication:
Towards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs
Date
2015
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
31679.pdf
1.05 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Cretu, Bogdan
;
Fang, Wen
;
Aoulaiche, Marc
;
Routoure, Jean-Marc
;
Carin, Regis
;
dos Santos, Sara
;
Luo, Jun
;
Zhao, Chao
;
Martino, Joao Martino
;
Claeys, Cor
Journal
Physica Status Solidi C
Abstract
Description
Metrics
Views
1961
since deposited on 2021-10-22
416
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1961
since deposited on 2021-10-22
416
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations