Publication:

Towards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs

Date

2015
Journal article
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-5218-4046
cris.virtualsource.department715a9ada-0798-46d2-a8ca-4775db9a8e46
cris.virtualsource.orcid715a9ada-0798-46d2-a8ca-4775db9a8e46
dc.contributor.authorSimoen, Eddy
dc.contributor.authorCretu, Bogdan
dc.contributor.authorFang, Wen
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorRoutoure, Jean-Marc
dc.contributor.authorCarin, Regis
dc.contributor.authordos Santos, Sara
dc.contributor.authorLuo, Jun
dc.contributor.authorZhao, Chao
dc.contributor.authorMartino, Joao Martino
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-22T22:54:13Z
dc.date.available2021-10-22T22:54:13Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.issn1610-1634
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25910
dc.identifier.urlhttp://onlinelibrary.wiley.com/doi/10.1002/pssc.201400075/abstract
dc.source.beginpage292
dc.source.endpage298
dc.source.issue3
dc.source.journalPhysica Status Solidi C
dc.source.volume12
dc.title

Towards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs

dc.typeJournal article
dspace.entity.typePublication
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