Marial characterization of Ge1-xSnx alloys for strained Ge CMOS devices

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Author(s)

Takeuchi, Shotaro

;

Shimura, Yosuke

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;

Vincent, Benjamin

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;

Clarysse, Trudo

;

Demeulemeester, Jelle

;

Temst, Kristiaan

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Vantomme, Andre

;

Dekoster, Johan

;

;

;

Nakatsuka, Osamu

;

Zaima, Shigeaki

Metrics

1896 since deposited on 2021-10-18

1last month

Acq. date: 2025-12-09