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Performance and reliability aspects of FOND: A new deep submicron CMOS device concept
Publication:
Performance and reliability aspects of FOND: A new deep submicron CMOS device concept
Date
1996
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bellens, Rudi
;
Van den Bosch, Geert
;
Habas, Predrag
;
Mieville, Jean-Paul
;
Badenes, Gonçal
;
Clerix, Andre
;
Groeseneken, Guido
;
Deferm, Ludo
;
Maes, Herman
Journal
IEEE Transactions on Electron Devices
Abstract
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2012
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2012
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations