Publication:

Performance and reliability aspects of FOND: A new deep submicron CMOS device concept

Date

1996
Journal article
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-3763-2098
cris.virtual.orcid0000-0001-9971-6954
cris.virtualsource.department2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
cris.virtualsource.departmentce03ac04-c546-4df1-a775-1c68e533233e
cris.virtualsource.orcid2fcc3f32-b96b-4ece-a34c-e0dd87c237c9
cris.virtualsource.orcidce03ac04-c546-4df1-a775-1c68e533233e
dc.contributor.authorBellens, Rudi
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorHabas, Predrag
dc.contributor.authorMieville, Jean-Paul
dc.contributor.authorBadenes, Gonçal
dc.contributor.authorClerix, Andre
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDeferm, Ludo
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorClerix, Andre
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDeferm, Ludo
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.date.accessioned2021-09-29T14:16:36Z
dc.date.available2021-09-29T14:16:36Z
dc.date.embargo9999-12-31
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1075
dc.source.beginpage1407
dc.source.endpage1415
dc.source.issue9
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume43
dc.title

Performance and reliability aspects of FOND: A new deep submicron CMOS device concept

dc.typeJournal article
dspace.entity.typePublication
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