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Conference contributions
Line profile measurement of advanced-FinFET features by reference metrology
Publication:
Line profile measurement of advanced-FinFET features by reference metrology
Date
2015
Proceedings Paper
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33256.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Takamasu, Kiyoshi
;
Iwaki, Y.
;
Takahashi, S.
;
Kawada, H.
;
Ikota, M.
;
Yamaguchu, A.
;
Lorusso, Gian
;
Horiguchi, Naoto
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1804
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1804
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations