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Detection of local Cu-to-Cu bonding defects in wafer-to-wafer hybrid bonding using GHz-SAM.
Publication:
Detection of local Cu-to-Cu bonding defects in wafer-to-wafer hybrid bonding using GHz-SAM.
Date
2018-11
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Wolf, Ingrid
;
Khaled, Ahmad
;
Kim, Soon-Wook
;
Beyne, Eric
;
Kögel, Michael
;
Brand, Sebastian
;
Djuric-Rissner, Tatiana
;
Ingo, Wiesler
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1879
since deposited on 2021-10-25
Acq. date: 2025-10-27
Citations
Metrics
Views
1879
since deposited on 2021-10-25
Acq. date: 2025-10-27
Citations