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Line edge roughness and critical dimension variation: Fractal characterization and comparison using model functions
Publication:
Line edge roughness and critical dimension variation: Fractal characterization and comparison using model functions
Date
2004-08
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Constantoudis, V.
;
Patsis, G.P.
;
Leunissen, Peter
;
Gogolides, E.
Journal
Journal of Vacuum Science and Technology B
Abstract
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1891
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations
Metrics
Views
1891
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations