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Measurements and analysis of substrate noise coupling in TSV based 3D integrated circuits
Publication:
Measurements and analysis of substrate noise coupling in TSV based 3D integrated circuits
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Araga, Yuuki
;
Nagata, Makoto
;
Van der Plas, Geert
;
Marchal, Pol
;
Libois, Michael
;
La Manna, Antonio
;
Zhang, Wenqi
;
Beyer, Gerald
;
Beyne, Eric
Journal
IEEE Transactions on Components, Packaging and Manufacturing Technology
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1991
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Views
1991
since deposited on 2021-10-22
1
last month
1
last week
Acq. date: 2026-08-03
Citations