Publication:
BTI Reliability of InGaAs nMOS gate-stack: on the impact of shallow and deep defect bands on the operating voltage range of III-V technology
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1995 since deposited on 2021-10-24
Acq. date: 2025-10-23
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Views
1995 since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations