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BTI Reliability of InGaAs nMOS gate-stack: on the impact of shallow and deep defect bands on the operating voltage range of III-V technology
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1997 since deposited on 2021-10-24
Acq. date: 2025-12-10
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1997 since deposited on 2021-10-24
Acq. date: 2025-12-10
Citations