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ALD growth behavior of high-k nanolayers on various substrates characterized by X-Ray Spectrometry in gracing incidence geometry
Publication:
ALD growth behavior of high-k nanolayers on various substrates characterized by X-Ray Spectrometry in gracing incidence geometry
Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Müller, Matthias
;
Sioncke, Sonja
;
Delabie, Annelies
;
Beckhoff, Burkhard
Journal
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Acq. date: 2025-10-23
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1906
since deposited on 2021-10-21
Acq. date: 2025-10-23
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Downloads
1
since deposited on 2021-10-21
Acq. date: 2025-10-23
Views
1906
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations