Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Quantification of area-selective deposition on nanometer-scale patterns using Rutherford backscattering spectrometry
Publication:
Quantification of area-selective deposition on nanometer-scale patterns using Rutherford backscattering spectrometry
Copy permalink
Date
2022
Journal article
https://doi.org/10.1038/s41598-022-22645-8
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
Published version
2.21 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claessens, Niels
;
Khan, Zamran Zahoor
;
Rahnemaihaghighi, Negin
;
Delabie, Annelies
;
Vantomme, Andre
;
Vandervorst, Wilfried
;
Meersschaut, Johan
Journal
SCIENTIFIC REPORTS
Abstract
Description
Metrics
Downloads
128
since deposited on 2022-11-12
25
last month
6
last week
Acq. date: 2025-12-15
Views
1418
since deposited on 2022-11-12
Acq. date: 2025-12-15
Citations
Metrics
Downloads
128
since deposited on 2022-11-12
25
last month
6
last week
Acq. date: 2025-12-15
Views
1418
since deposited on 2022-11-12
Acq. date: 2025-12-15
Citations