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Conference contributions
P-N junction diagnostics of the electrical epi-layer quality: a feasibility study
Publication:
P-N junction diagnostics of the electrical epi-layer quality: a feasibility study
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Date
1998
Proceedings Paper
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2586.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Poyai, Amporn
;
Claeys, Cor
;
Czerwinski, A.
Journal
Abstract
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2033
since deposited on 2021-10-01
Acq. date: 2025-12-16
Citations
Metrics
Views
2033
since deposited on 2021-10-01
Acq. date: 2025-12-16
Citations