Publication:

Atomic Force Microscopy: From research lab to High-Volume Manufacturing

Date

2025-02-24

Proceedings Paper

https://doi.org/10.1117/12.3051414

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Author(s)

;

Charley, Anne-Laure

;

Leray, Philippe

Journal

Proceedings of SPIE

Statistics

44 since deposited on 2025-07-28

4last month

Acq. date: 2026-02-25