Publication:
Atomic Force Microscopy: From research lab to High-Volume Manufacturing
| dc.contributor.author | Moussa, Alain | |
| dc.contributor.author | Charley, Anne-Laure | |
| dc.contributor.author | Leray, Philippe | |
| dc.contributor.imecauthor | Moussa, A. | |
| dc.contributor.imecauthor | Charley, A. -L. | |
| dc.contributor.imecauthor | Leray, P. | |
| dc.date.accessioned | 2025-07-28T03:57:08Z | |
| dc.date.available | 2025-07-28T03:57:08Z | |
| dc.date.issued | 2025-02-24 | |
| dc.description.wosFundingText | This work has been enabled in part by the NanoIC pilot line. The acquisition and operation are jointly funded by the Chips Joint Undertaking, through the European Union's Digital Europe (101183266) and Horizon Europe programs (101183277), as well as by the participating states Belgium (Flanders), France, Germany, Finland, Ireland and Romania. For more information, visit nanoic-project.eu. | |
| dc.identifier.doi | 10.1117/12.3051414 | |
| dc.identifier.eisbn | 978-1-5106-8639-7 | |
| dc.identifier.isbn | 978-1-5106-8638-0 | |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/45951 | |
| dc.publisher | SPIE-INT SOC OPTICAL ENGINEERING | |
| dc.source.beginpage | 134260X-1 | |
| dc.source.conference | 2025 Conference on Metrology Inspection and Process Control-Annual | |
| dc.source.conferencedate | FEB 24-28, 2025 | |
| dc.source.conferencelocation | San Jose | |
| dc.source.endpage | 134260X-10 | |
| dc.source.journal | Proceedings of SPIE | |
| dc.source.numberofpages | 10 | |
| dc.title | Atomic Force Microscopy: From research lab to High-Volume Manufacturing | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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