Publication:

Exploration of gate trench module for vertical GaN devices

Date

2020
Journal article
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Author(s)

Ruzzarin, Maria  
;
Geens, Karen  
;
Borga, Matteo  
;
Liang, Hu  
;
You, Shuzhen  
;
Bakeroot, Benoit  
;
Decoutere, Stefaan  
;
De Santi, Carlo
;
Neviani, Andrea
;
Meneghini, Matteo
;
Meneghesso, Gaudenzio
;
Zanoni, Enrico

Journal

Microelectronics Reliability

Abstract

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2016 since deposited on 2021-10-29
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Acq. date: 2026-04-25

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