Exploration of gate trench module for vertical GaN devices

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Author(s)

Ruzzarin, Maria

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Bakeroot, Benoit

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Decoutere, Stefaan

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De Santi, Carlo

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Neviani, Andrea

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Meneghini, Matteo

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Meneghesso, Gaudenzio

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Journal

Microelectronics Reliability

Metrics

2005 since deposited on 2021-10-29

Acq. date: 2025-10-24