Publication:

Exploration of gate trench module for vertical GaN devices

Date

2020
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorRuzzarin, Maria
dc.contributor.authorGeens, Karen
dc.contributor.authorBorga, Matteo
dc.contributor.authorLiang, Hu
dc.contributor.authorYou, Shuzhen
dc.contributor.authorBakeroot, Benoit
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorDe Santi, Carlo
dc.contributor.authorNeviani, Andrea
dc.contributor.authorMeneghini, Matteo
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorZanoni, Enrico
dc.contributor.imecauthorRuzzarin, Maria
dc.contributor.imecauthorGeens, Karen
dc.contributor.imecauthorBorga, Matteo
dc.contributor.imecauthorLiang, Hu
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorBakeroot, Benoit
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecGeens, Karen::0000-0003-1815-3972
dc.contributor.orcidimecBorga, Matteo::0000-0003-3087-6612
dc.contributor.orcidimecBakeroot, Benoit::0000-0003-4392-1777
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2021-10-29T03:19:45Z
dc.date.available2021-10-29T03:19:45Z
dc.date.issued2020
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35862
dc.identifier.urlhttps://doi.org/10.1016/j.microrel.2020.113828
dc.source.beginpage113828
dc.source.journalMicroelectronics Reliability
dc.source.volume114
dc.title

Exploration of gate trench module for vertical GaN devices

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles