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Conference contributions
Characterization of voltage and frequency dependent parasitics observed in Si passivated germanium metal gate pMOSFETs
Publication:
Characterization of voltage and frequency dependent parasitics observed in Si passivated germanium metal gate pMOSFETs
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Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Krom, Raymond
;
Mitard, Jerome
;
Plourde, Chelsea
;
De Jaeger, Brice
;
Meuris, Marc
;
Heyns, Marc
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1882
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Acq. date: 2025-12-10
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Metrics
Views
1882
since deposited on 2021-10-17
1
last month
Acq. date: 2025-12-10
Citations