Publication:

Characterization of voltage and frequency dependent parasitics observed in Si passivated germanium metal gate pMOSFETs

Date

2008
Meeting abstract
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dc.contributor.authorKrom, Raymond
dc.contributor.authorMitard, Jerome
dc.contributor.authorPlourde, Chelsea
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.date.accessioned2021-10-17T08:03:07Z
dc.date.available2021-10-17T08:03:07Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13963
dc.source.conference32nd Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE
dc.source.conferencedate18/05/2008
dc.source.conferencelocationLeuven Belgium
dc.title

Characterization of voltage and frequency dependent parasitics observed in Si passivated germanium metal gate pMOSFETs

dc.typeMeeting abstract
dspace.entity.typePublication
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