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Grazing incidence X-ray fluorescence spectrometry for compositional analysis of nanometer-thin high-k dielectric HfO2 layers
Publication:
Grazing incidence X-ray fluorescence spectrometry for compositional analysis of nanometer-thin high-k dielectric HfO2 layers
Date
2005-07
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hellin, David
;
Delabie, Annelies
;
Puurunen, Riikka
;
Beaven, Peter
;
Conard, Thierry
;
Brijs, Bert
;
De Gendt, Stefan
;
Vinckier, Chris
Journal
Analytical Sciences
Abstract
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1939
since deposited on 2021-10-16
Acq. date: 2025-10-24
Citations
Metrics
Views
1939
since deposited on 2021-10-16
Acq. date: 2025-10-24
Citations