Publication:

Si GAA NW FETs threshold voltage evaluation

Date

2022
Journal article
https://doi.org/10.1016/j.sse.2022.108317
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dc.contributor.authorDobrescu, Dragos
dc.contributor.authorCretu, Bogdan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVeloso, Anabela
dc.contributor.authorVoicu-Spineanu, Andrei
dc.contributor.authorDobrescu, Lidia
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2022-12-07T11:02:21Z
dc.date.available2022-05-27T02:22:56Z
dc.date.available2022-12-07T11:02:21Z
dc.date.issued2022
dc.identifier.doi10.1016/j.sse.2022.108317
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39895
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.source.beginpage108317
dc.source.endpagena
dc.source.issuena
dc.source.journalSOLID-STATE ELECTRONICS
dc.source.numberofpages4
dc.source.volume194
dc.subject.keywordsEXTRACTION
dc.title

Si GAA NW FETs threshold voltage evaluation

dc.typeJournal article
dspace.entity.typePublication
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