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Forksheet FETs for Advanced CMOS Scaling: Forksheet-Nanosheet Co-Integration and Dual Work Function Metal Gates at 17nm N-P Space
Publication:
Forksheet FETs for Advanced CMOS Scaling: Forksheet-Nanosheet Co-Integration and Dual Work Function Metal Gates at 17nm N-P Space
Date
2021
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mertens, Hans
;
Ritzenthaler, Romain
;
Oniki, Yusuke
;
Briggs, Basoene
;
Chan, BT
;
Hikavyy, Andriy
;
Hopf, Toby
;
Mannaert, Geert
;
Tao, Zheng
;
Sebaai, Farid
;
Peter, Antony
;
Vandersmissen, Kevin
;
Dupuy, Emmanuel
;
Rosseel, Erik
;
Batuk, Dmitry
;
Geypen, Jef
;
Martinez Alanis, Gerardo Tadeo
;
Abigail, Daniel_
;
Grieten, Eva
;
D'have, Koen
;
Mitard, Jerome
;
Subramanian, Sujith
;
Ragnarsson, Lars-Ake
;
Weckx, Pieter
;
Chehab, Bilal
;
Hellings, Geert
;
Ryckaert, Julien
;
Dentoni Litta, Eugenio
;
Horiguchi, Naoto
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2241
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Metrics
Views
2241
since deposited on 2021-10-31
457
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations