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Experimental determination of inelastic mean free paths for calculation of TEM specimen thickness
Publication:
Experimental determination of inelastic mean free paths for calculation of TEM specimen thickness
Date
2011
Meeting abstract
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22584.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verleysen, Eveline
;
Bender, Hugo
;
Schryvers, Dominique
;
Vandervorst, Wilfried
Journal
Abstract
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1879
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Acq. date: 2025-12-09
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Metrics
Views
1879
since deposited on 2021-10-19
4
last month
Acq. date: 2025-12-09
Citations