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Anomalous positive-bias temperature instability of high-k/metal gate devices with Dy2O3 capping
Publication:
Anomalous positive-bias temperature instability of high-k/metal gate devices with Dy2O3 capping
Date
2008
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
O'Connor, Robert
;
Chang, Vincent
;
Pantisano, Luigi
;
Ragnarsson, Lars-Ake
;
Aoulaiche, Marc
;
O'Sullivan, Barry
;
Groeseneken, Guido
Journal
Applied Physics Letters
Abstract
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1914
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1914
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations