Publication:
Impact of Ge content and recess depth on the leakage current in strained Si1-xGex/Si heterojunctions
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1 since deposited on 2021-10-19
Acq. date: 2025-12-10
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Acq. date: 2025-12-10
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1 since deposited on 2021-10-19
Acq. date: 2025-12-10
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1896 since deposited on 2021-10-19
1last month
Acq. date: 2025-12-10
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